From Contamination to Defects, Faults and Yield Loss: Simulation and Applications

 ( Book Product ) 

• From Contamination to Defects, Faults and Yield Loss: Simulation and Applications available on October 19 2025 from Buy for 149
  
• ISBN bar code 9780792397144 ξ2 registered May 12 2012
  
• ISBN bar code 9780792397144 ξ1 registered February 01 2015
  
• Product category is Book

     
     

     
     
 

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^ Wojciech Maly, Jitendra B. KhareFrontiers in Electronic Testing: From Contamination to Defects, Faults and Yield Loss : Simulation and Applications 5 by Jitendra B. Khare and Wojciech Maly (1996, Hardcover) ISBN 9780792397144 (revised Feb 2017)
^  From Contamination to Defects, Faults and Yield Loss: Simulation and Applications  Buy. ISBN 9780792397144 (revised Oct 2025)