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Handbook of Charged Particle Optics, Second Edition
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ISBN 9781420045550
REGISTERED: 04/23/18
UPDATED: 10/27/20

The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments.


Specifications
  • ISBN bar code 9781420045550 ξ1 registered September 22 2015
  • Product category is Book

With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.


References
    ^ (2008). Handbook of Charged Particle Optics, Second Edition (revised Oct 2015)

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